TRUSTED
Foundry Services
State-of-the-art, fully calibrated Critical Dimension, Defect Review and Inspection tools providing complete foundry solutions for customers at any level of development or production.
Equipment
CD-SEM, DR-SEM and Inspection Equipment
Our state-of-the-art facility, equipment, and technicians provide (our) customers with exceptional services and support, every step of the way. Our teams are extensively trained using the most innovative dimensional measurement tools available today including ???
Custom-tailored Solutions
Special Wafer Processing
Our demo lab and foundry service is fully capable of processing transparent and exotic wafer types including Silicon Carbide H4 and H6, GaAs, Sapphire wafers, ZnO, Gallium Nitride wafers, Lithium Niobate wafers, SOI, and Quartz.
Extra space for more
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Quality Services
All Inculsive Services
Capability to run 100mm, 125mm,150mm, 200mm, and 300mm wafers.
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Bare and Patterned Wafer Inspection
Bare and
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Extra Block for more info if needed w/ button
Custom-tailored Solutions
Calibration Standards
Electronic Certificates of Calibration are provided with all applicable NIST or certificate trace number(s) and we maintain a complete documentation control system. In addition, our ISO quality assurance program monitors the services being provided by our Metrology Lab to ensure complete customer satisfaction.
ADC, ADR, and API Process for Customer Wafers.
WE support Over 270 systems globally
OUR SERVICES
QUALITY SERVICES
TAILORED FOR YOU
1. special wafer thickness
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2. equipment testing
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3. Transparent and Exotic Wafer Processing
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4. Extra Space
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Contact us
Learn More
480 400 6910
sales@gti.com
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Contact Us
more space more info
Calibration Wafers
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Calibration
Designation
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Calibration
Designation
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Calibration
Designation
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Wafer
Designation
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Wafer
Designation
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Wafer
Designation
gti logos?
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Metrology Experts ❍ GTI
Services
DEFECT REVIEW
Automatic defect retention and automatic defect classification.
EDX and Material Analysis for bare or patterned wafers — with defect size from 2 microns down to 20nm.
CRITICAL DIMENSION
nist tracable callibrated CD TOOL for customer use — with measuring capabilities from 5micron down to 20nm+_ .65 nm
Inspection
darkfield inspection tool
another example of wafer block
Calibration Wafers
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innovative
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CREATIVE
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